✦ LIBER ✦

Test generation for sequential circuits based on boolean function manipulation

✍ Scribed by Hoyong Choi; Takashi Kohara; Nagisa Ishiura; Isao Shirakawa; Akira Motohara

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Functional versus random test generation

✍ Margot Karam; Gabriele Saucier 📂 Article 📅 1993 🏛 Springer US 🌐 English ⚖ 691 KB

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On the Use of Functional Test Generation

✍ Irith Pomeranz; Sudhakar M. Reddy 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 223 KB

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✍ El-Maleh, A.H.; Khursheed, S.S.; Sait, S.M. 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 398 KB

A storage-based built-in test pattern ge

✍ Pomeranz, I.; Reddy, S.M. 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 397 KB