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Test data compression and decompression based on internal scan chains and Golomb coding

โœ Scribed by Chandra, A.; Chakrabarty, K.


Book ID
118698258
Publisher
IEEE
Year
2002
Tongue
English
Weight
421 KB
Volume
21
Category
Article
ISSN
0278-0070

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A new scheme of test data compression/decompression, namely coding of even bits marking and selective output inversion, is presented. It first uses a special kind of codewords, odd bits of which are used to represent the length of runs and even bits of which are used to represent whether the codewor