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Temperature-dependent defect density measurements in hydrogenated amorphous silicon

✍ Scribed by Sufi Zafar; E.A Schiff

Book ID: 115987127
Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 184 KB
Volume: 114
Category: Article
ISSN: 0022-3093
DOI: 10.1016/0022-3093(89)90668-6

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