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Electron mobility-lifetime product and D° defect density in hydrogenated amorphous silicon

✍ Scribed by S.P Hotaling; Homer Antoniadis; E.A Schiff


Book ID
115987064
Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
202 KB
Volume
114
Category
Article
ISSN
0022-3093

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✍ S.P. Hotaling; Homer Antoniadis; E.A. Schiff 📂 Article 📅 1989 🏛 Elsevier Science ⚖ 335 KB

Electron deep-trapping mobility-lifetime (/~r) products were measured in a series of hydrogenated amorphous silicon (a-Si:H) specimens using the transient photocurrent charge-collection technique. A logarithmic dependence of the resulting /~r estimate upon the collection time was observed. The corre