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Temperature dependent capacitance voltage measurements for the detection of trap levels in semiconductors

✍ Scribed by H.J. Rijks; J.R. Monkowski; L.J. Giling; J. Bloem


Book ID
107856533
Publisher
Elsevier Science
Year
1981
Tongue
English
Weight
312 KB
Volume
24
Category
Article
ISSN
0038-1101

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