✦ LIBER ✦
Thermally stimulated capacitance for shallow majority‐carrier traps in the edge region of semiconductor junctions
✍ Scribed by Sah, C.T.; Walker, J.W.
- Book ID
- 118256728
- Publisher
- American Institute of Physics
- Year
- 1973
- Tongue
- English
- Weight
- 453 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0003-6951
No coin nor oath required. For personal study only.