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Temperature dependence of minority carrier lifetime in VPE GaP:N, Te

✍ Scribed by Woggon, Ulrike ;Wandel, K. ;Weinert, H.

Publisher: John Wiley and Sons
Year: 1984
Tongue: English
Weight: 188 KB
Volume: 82
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210820253

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