✦ LIBER ✦
Experimental Investigations on the Influence of Surface and Interface Recombination on the Minority Carrier Lifetime in LPE-GaP :N, Si VPE-GaP:N, Te, and VPE-GaAs0.12P0.88:N, Te
✍ Scribed by Gehrke, Elke ;Wandel, K. ;Weinert, H.
- Publisher
- John Wiley and Sons
- Year
- 1986
- Tongue
- English
- Weight
- 419 KB
- Volume
- 96
- Category
- Article
- ISSN
- 0031-8965
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