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Minority carrier lifetime in VPE-GaP:N, Te at various excitation levels

โœ Scribed by Wandel, K. ;Wurbs, G. ;Bindemann, R. ;Kiksch, A. ;Schwabe, R.


Publisher
John Wiley and Sons
Year
1981
Tongue
English
Weight
677 KB
Volume
65
Category
Article
ISSN
0031-8965

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