Temperature dependence of carrier lifeti
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Chen, Fei ;Cartwright, A. N. ;Lu, H. ;Schaff, W. J.
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Article
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2005
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John Wiley and Sons
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English
β 74 KB
## Abstract Timeβresolved pumpβprobe transmission measurements were used to determine the temperature dependence of carrier lifetime for InN epilayers with unintentionally doped levels from 10^18^ to 10^19^ cm^β3^. The observed decay time at 20 K is well explained by a dominating radiative interban