๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Temperature and gate voltage dependence of hole mobility in polycrystalline oligothiophene thin film transistors

โœ Scribed by Horowitz, Gilles; Hajlaoui, Mohsen E.; Hajlaoui, Riadh


Book ID
127337256
Publisher
American Institute of Physics
Year
2000
Tongue
English
Weight
274 KB
Volume
87
Category
Article
ISSN
0021-8979

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Thickness Dependence of Mobility in Pent
โœ R. Ruiz; A. Papadimitratos; A.โ€‰C. Mayer; G.โ€‰G. Malliaras ๐Ÿ“‚ Article ๐Ÿ“… 2005 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 252 KB ๐Ÿ‘ 2 views

UV-vis (acetonitrile) : k max (e) = 239 nm (85), 301 nm (28). 1 H NMR and 13 C NMR spectra in CDCl 3 . The mass spectrum and FTIR spectrum are same as those reported previously from our group [16a]. Detailed experimental methods and characterization data are available in the Supporting Information