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Temperature dependence of hole mobilities in Te thin films

✍ Scribed by Kubový, A. ;Janda, M.


Book ID
105371614
Publisher
John Wiley and Sons
Year
1976
Tongue
English
Weight
287 KB
Volume
36
Category
Article
ISSN
0031-8965

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Drift mobility measurements were. performed on the hole-transport organic semiconductor chloro-aluminum phthalocyanine using a time-of--flight technique. The photocurmnt transients were featureless decay curves and transit times were determined from the logarithmic representation of photocurrent ver