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Temperature and electric field dependence of hopping transport in ion-implanted Si:As

✍ Scribed by Chen Gang; H.D. Koppen; R.W. van der Heijden; A.T.A.M. de Waele; H.M. Gijsman; F.P.B. Tielen


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
356 KB
Volume
72
Category
Article
ISSN
0038-1098

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