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Temperature and electric field dependence of hopping transport in ion-implanted Si:As : Chen Gang, H. D. Koppen, R. W. van der Heijden, A. T. A. M. de Waele and H. M. Ginjsman. Solid St. Commun.72(2), 173 (1989)


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
110 KB
Volume
30
Category
Article
ISSN
0026-2714

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