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TEM study of defects in AlxGa1−xN layers with different polarity

✍ Scribed by A.V. Tikhonov; T.V. Malin; K.S. Zhuravlev; L. Dobos; B. Pecz

Book ID
116630066
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
636 KB
Volume
338
Category
Article
ISSN
0022-0248

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