๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Techniques for minimizing power dissipation in scan and combinational circuits during test application

โœ Scribed by Dabholkar, V.; Chakravarty, S.; Pomeranz, I.; Reddy, S.


Book ID
119778404
Publisher
IEEE
Year
1998
Tongue
English
Weight
328 KB
Volume
17
Category
Article
ISSN
0278-0070

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES