Multiple scan chains for power minimization during test application in sequential circuits

✍ Scribed by Nicolici, N.; Al-Hashimi, B.M.

• Book ID: 118697601
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 661 KB
• Volume: 51
• Category: Article
• ISSN: 0018-9340
• DOI: 10.1109/tc.2002.1009155