Reduction of power consumption in scan-based circuits during test application by an input control technique

✍ Scribed by Tsung-Chu Huang; Kuen-Jong Lee

• Book ID: 119778800
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 247 KB
• Volume: 20
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/43.931040