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[IEEE Comput. Soc Eighth Asian Test Symposium - Shanghai, China (16-18 Nov. 1999)] Proceedings Eighth Asian Test Symposium (ATS'99) - An input control technique for power reduction in scan circuits during test application

✍ Scribed by Tsung-Chu Huang, ; Kuen-Jeng Lee,

No coin nor oath required. For personal study only.

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