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[IEEE Comput. Soc Eighth Asian Test Symposium - Shanghai, China (16-18 Nov. 1999)] Proceedings Eighth Asian Test Symposium (ATS'99) - Automatic test pattern generation for improving the fault coverage of microprocessors

โœ Scribed by Hirase, J.; Yoshimura, S.; Sezaki, T.


Book ID
126689016
Publisher
IEEE Comput. Soc
Year
1999
Weight
293 KB
Category
Article
ISBN-13
9780769503158

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