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TAO-BIST: A framework for testability analysis and optimization for built-in self-test of RTL circuits

✍ Scribed by Ravi, S.; Lakshminarayana, G.; Jha, N.K.

Book ID: 119778648
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 272 KB
Volume: 19
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.856976

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