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A complete scheme of built-in self-tests (BIST) structure for fault diagnosis in analog circuits and systems

✍ Scribed by Hatzopoulos, A.A.; Siskos, S.; Kontoleon, J.M.

Book ID: 114542614
Publisher: IEEE
Year: 1993
Tongue: English
Weight: 572 KB
Volume: 42
Category: Article
ISSN: 0018-9456
DOI: 10.1109/19.231591

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