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[IEEE Technology of Integrated Systems in Nanoscale Era (DTIS) - Hammamet, Tunisia (2010.03.23-2010.03.25)] 5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era - A new built-in self-test (BIST) for a RF low-noise amplifier (LNA)

✍ Scribed by Ayadi, R.; Masmoudi, M.

Book ID: 117998772
Publisher: IEEE
Year: 2010
Weight: 434 KB
Volume: 0
Category: Article
ISBN: 1424463386
DOI: 10.1109/dtis.2010.5487559

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