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[IEEE Technology of Integrated Systems in Nanoscale Era (DTIS) - Hammamet, Tunisia (2010.03.23-2010.03.25)] 5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Data acquisition test platform for non uniformly controlled ADC

✍ Scribed by Maalej, Asma; Ben-Romdhane, Manel; Desgreys, Patricia; Loumeau, Patrick; Rebai, Chiheb; Ghazel, Adel

Book ID: 121874868
Publisher: IEEE
Year: 2010
Weight: 473 KB
Category: Article
ISBN: 1424463386
DOI: 10.1109/DTIS.2010.5487563

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