𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - A new hierarchical built-in self-test with on-chip diagnosis for VLIW processors

✍ Scribed by Ulbricht, Markus; Scholzel, Mario; Koal, Tobias; Vierhaus, Heinrich Theodor

Book ID: 120203782
Publisher: IEEE
Year: 2011
Weight: 677 KB
Category: Article
ISBN: 1424497558
DOI: 10.1109/DDECS.2011.5783067

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Systems (DDECS) - Cottbus, Germany

[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - Characterization of digital cells for statistical test

✍ Hopsch, Fabian; Lindig, Michael; Straube, Bernd; Vermeiren, Wolfgang 📂 Article 📅 2011 🏛 IEEE ⚖ 958 KB

[IEEE Systems (DDECS) - Cottbus, Germany

[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - Hardware efficient design of Variable Length FFT Processor

✍ Gautam, Vinay; Ray, Kailash Chandra; Haddow, Pauline 📂 Article 📅 2011 🏛 IEEE ⚖ 690 KB

[IEEE Systems (DDECS) - Cottbus, Germany

[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - Hardware architecture for packet classification with prefix coloring

✍ Pus, Viktor; Kajan, Michal; Korenek, Jan 📂 Article 📅 2011 🏛 IEEE ⚖ 605 KB

[IEEE Systems (DDECS) - Cottbus, Germany

[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - Proof certificates and non-linear arithmetic constraints

✍ Kupferschmid, S.; Becker, B.; Teige, T.; Franzle, M. 📂 Article 📅 2011 🏛 IEEE ⚖ 586 KB

[IEEE Systems (DDECS) - Cottbus, Germany

[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - On using a SPICE-like TSTAC™ eFlash model for design and test

✍ Mauroux, P.-D.; Virazel, A.; Bosio, A.; Dilillo, L.; Girard, P.; Pravossoudovitc 📂 Article 📅 2011 🏛 IEEE ⚖ 891 KB

[IEEE Systems (DDECS) - Cottbus, Germany

[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - TLM protocol compliance checking at the Electronic System Level

✍ Bawadekji, Mohamed; Grosse, Daniel; Drechsler, Rolf 📂 Article 📅 2011 🏛 IEEE ⚖ 739 KB