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[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - On using a SPICE-like TSTAC™ eFlash model for design and test

✍ Scribed by Mauroux, P.-D.; Virazel, A.; Bosio, A.; Dilillo, L.; Girard, P.; Pravossoudovitch, S.; Godard, B.; Festes, G.; Vachez, L.

Book ID: 120573522
Publisher: IEEE
Year: 2011
Weight: 891 KB
Category: Article
ISBN: 1424497558
DOI: 10.1109/DDECS.2011.5783111

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