The white beam Synchrotron X-Ray Topography (SXRT) technique was used to assess the quality of sapphire wafers grown by the Heat-Exchanger Method (HEM) and the Modified Czochralski Method (MCM). Sapphire is a potential new material for X-ray crystal optics, especially for use as Bragg backscattering
β¦ LIBER β¦
Synchrotron white-beam X-ray topography of ribonuclease S crystals
β Scribed by Vetter, W. M. ;Gallagher, D. T. ;Dudley, M.
- Book ID
- 111752009
- Publisher
- International Union of Crystallography
- Year
- 2002
- Tongue
- English
- Weight
- 398 KB
- Volume
- 58
- Category
- Article
- ISSN
- 0907-4449
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