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White beam synchrotron topography using a high resolution digital X-ray imaging detector

✍ Scribed by A.N. Danilewsky; A. Rack; J. Wittge; T. Weitkamp; R. Simon; H. Riesemeier; T. Baumbach

Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 832 KB
Volume: 266
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2008.02.065

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