High spatial resolution stress measurements using synchrotron based scanning X-ray microdiffraction with white or monochromatic beam

✍ Scribed by N. Tamura; H.A. Padmore; J.R. Patel

• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 427 KB
• Volume: 399
• Category: Article
• ISSN: 0921-5093
• DOI: 10.1016/j.msea.2005.02.033