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Synchrotron X-ray topography of bismuth silicon oxide crystals

✍ Scribed by J. Martínez-López; M. González-Mañas; M.A. Caballero; E. Diéguez; B. Capelle

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 205 KB
Volume: 166
Category: Article
ISSN: 0022-0248
DOI: 10.1016/0022-0248(96)00107-8

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