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Surface roughness evolution in the growth of a-Si: H thin films studied by ellipsometry

✍ Scribed by A. Canillas; J. Campmany; J.L. Andújar; E. Bertran; J.L. Morenza


Book ID
118364570
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
414 KB
Volume
251-252
Category
Article
ISSN
0039-6028

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