✦ LIBER ✦

Surface roughness and interface diffusion studies on thin Mo and W films and Mo/Si and W/Si interfaces

✍ Scribed by D. Bhattacharyya; A.K. Poswal; M. Senthilkumar; P.V. Satyam; A.K. Balamurugan; A.K. Tyagi; N.C. Das

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Thermal stability of multilayer films Pt

✍ Jiang, Zuimin; Jiang, Xiaoming; Liu, Wenhan; Wu, Ziqin 📂 Article 📅 1989 🏛 American Institute of Physics 🌐 English ⚖ 665 KB

Interfaces formed by evaporation of Si o

✍ T.A. Nguyen Tan; M. Azizan; R.C. Cinti; G. Chauvet; R. Baptist 📂 Article 📅 1985 🏛 Elsevier Science ⚖ 46 KB

Interfaces formed by evaporation of Si o

✍ T.A. Nguyen Tan; M. Azizan; R.C. Cinti; G. Chauvet; R. Baptist 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 228 KB

Study of the Mo thin films and Mo/CIGS i

✍ L. Assmann; J.C. Bernède; A. Drici; C. Amory; E. Halgand; M. Morsli 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 266 KB

Interface roughness, surface roughness a

✍ Junling Qin; Jianda Shao; Kui Yi; Zhengxiu Fan 📂 Article 📅 2007 🏛 Optics InfoBase 🌐 English ⚖ 247 KB

Ellipsometric study of Si surface roughn

✍ A Aizenberg; AV Andrianov; SV Nosenko; VI Pshenicin; IA Hromcovski 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 125 KB