𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Surface potential measurements using the Kelvin probe force microscope

✍ Scribed by Masatoshi Yasutake; Daisuke Aoki; Masamichi Fujihira


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
491 KB
Volume
273
Category
Article
ISSN
0040-6090

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Surface potential studies of self-assemb
✍ LΓΌ, J.; Eng, L.; Bennewitz, R.; Meyer, E.; GΓΌntherodt, H.-J; Delamarche, E.; Sca πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 307 KB πŸ‘ 2 views

The local contact potential di †erence (CPD) of di †erent self-assembled n-alkanethiol monolayers on Au substrates has been measured using Kelvin probe force microscopy (KPFM). Our results demonstrate that KPFM can be used to obtain topography and CPD information simultaneously. The measured CPDs sh

ChemInform Abstract: Atomic Force Micros
✍ M. BOEHMISCH; F. BURMEISTER; A. RETTENBERGER; J. ZIMMERMANN; J. BONEBERG; P. LEI πŸ“‚ Article πŸ“… 2010 πŸ› John Wiley and Sons βš– 29 KB πŸ‘ 1 views

potentials, cells, elements (inorganic) F 3000 ## 12 -012 Atomic Force Microscope (AFM) Based Kelvin Probe Measurements: Application to an Electrochemical Reaction. -The title method is used to determine work functions of metals and semiconductors quantitatively with respect to the energetics of