Surface potential measurements using the Kelvin probe force microscope
β Scribed by Masatoshi Yasutake; Daisuke Aoki; Masamichi Fujihira
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 491 KB
- Volume
- 273
- Category
- Article
- ISSN
- 0040-6090
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π SIMILAR VOLUMES
The local contact potential di β erence (CPD) of di β erent self-assembled n-alkanethiol monolayers on Au substrates has been measured using Kelvin probe force microscopy (KPFM). Our results demonstrate that KPFM can be used to obtain topography and CPD information simultaneously. The measured CPDs sh
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