✦ LIBER ✦
ChemInform Abstract: Atomic Force Microscope (AFM) Based Kelvin Probe Measurements: Application to an Electrochemical Reaction.
✍ Scribed by M. BOEHMISCH; F. BURMEISTER; A. RETTENBERGER; J. ZIMMERMANN; J. BONEBERG; P. LEIDERER
- Publisher
- John Wiley and Sons
- Year
- 2010
- Weight
- 29 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0931-7597
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✦ Synopsis
potentials, cells, elements (inorganic) F 3000
12 -012
Atomic Force Microscope (AFM) Based Kelvin Probe Measurements: Application to an Electrochemical Reaction.
-The title method is used to determine work functions of metals and semiconductors quantitatively with respect to the energetics of an electrochemical reaction on a p-doped WSe 2 sample under ambient conditions. The corrosion reaction can be induced and controlled by an externally applied voltage between the AFM tip and WSe 2 . Thus, it could be used for etching nanostructures. -