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Surface plasmon resonances of optical antenna atomic force microscope tips

โœ Scribed by Zou, Yanshu; Steinvurzel, Paul; Yang, Tian; Crozier, Kenneth B.

Book ID
120501134
Publisher
American Institute of Physics
Year
2009
Tongue
English
Weight
531 KB
Volume
94
Category
Article
ISSN
0003-6951

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The atomic force microscope (AFM) continues to fi nd increasing applications in nanoscale imaging, [ 1 ] metrology, [ 2 ] devices, [ 3 ] and manufacturing. [ 4 ] In these applications, tip size and shape critically affect the accuracy, resolution, and reliability of measurements and processes. [ 5 ]