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Scanning plasmon optical microscope operation in atomic force microscope mode

โœ Scribed by Kim, Y-K.; Ketterson, J. B.; Morgan, D. J.

Book ID
115421641
Publisher
Optical Society of America
Year
1996
Tongue
English
Weight
776 KB
Volume
21
Category
Article
ISSN
0146-9592

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A new kind of scanning probe microscope is introduced in this paper, which is a combination of atomic force microscope and reflection scanning near field optical microscopy (AF/RSNOM) with equi-amplitude tapping mode. The principle and recent experiment result of AF/RSNOM are reported. Besides conve