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Near-Field Scanning Optical Microscopy Combined with a Tapping Mode Atomic Force Microscope

✍ Scribed by Takayuki Okamoto; Ichirou Yamaguchi

Publisher
Optical Society of Japan
Year
1997
Tongue
English
Weight
658 KB
Volume
4
Category
Article
ISSN
1340-6000

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✍ Yinli Li; Shifa Wu; Pengfei Li; Jian Zhang; Shi Pan πŸ“‚ Article πŸ“… 2006 πŸ› Elsevier Science 🌐 English βš– 204 KB

A new kind of scanning probe microscope is introduced in this paper, which is a combination of atomic force microscope and reflection scanning near field optical microscopy (AF/RSNOM) with equi-amplitude tapping mode. The principle and recent experiment result of AF/RSNOM are reported. Besides conve