## Abstract This manuscript reviews the principles and recent advances of scanning near‐field optical microscopy based on tip‐induced field enhancement. These scanning microscopes utilize minute probes to locally enhance an electromagnetic field through a complex interplay between surface plasmon e
Combined scanning near field optical and force microscopy
✍ Scribed by N. F. van Hulst; M. H. P. Moers; R. G. Tack; B. BöLger
- Publisher
- John Wiley and Sons
- Year
- 1993
- Tongue
- English
- Weight
- 214 KB
- Volume
- 25
- Category
- Article
- ISSN
- 1059-910X
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