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Design and application of scanning near-field optical/atomic force microscopy

✍ Scribed by Tatsuaki Ataka; Hiroshi Muramatsu; Kunio Nakajima; Norio Chiba; Katsunori Homma; Masamichi Fujihara

Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
655 KB
Volume
273
Category
Article
ISSN
0040-6090

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## Abstract This manuscript reviews the principles and recent advances of scanning near‐field optical microscopy based on tip‐induced field enhancement. These scanning microscopes utilize minute probes to locally enhance an electromagnetic field through a complex interplay between surface plasmon e