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Aligning DNA on Si surface and cutting off by tips of atomic force microscope

✍ Scribed by Hui Li; Baoshan Han

Book ID: 105731109
Publisher: Springer
Year: 2003
Tongue: English
Weight: 892 KB
Volume: 48
Category: Article
ISSN: 1001-6538
DOI: 10.1007/bf03187056

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