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Orientational Ordering of Polymers by Atomic Force Microscope Tip-Surface Interaction

โœ Scribed by LEUNG, O. M.; GOH, M. C.

Book ID
121151338
Publisher
American Association for the Advancement of Science
Year
1992
Tongue
English
Weight
601 KB
Volume
255
Category
Article
ISSN
0036-8075

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The atomic force microscope (AFM) continues to fi nd increasing applications in nanoscale imaging, [ 1 ] metrology, [ 2 ] devices, [ 3 ] and manufacturing. [ 4 ] In these applications, tip size and shape critically affect the accuracy, resolution, and reliability of measurements and processes. [ 5 ]