The atomic force microscope (AFM) continues to fi nd increasing applications in nanoscale imaging, [ 1 ] metrology, [ 2 ] devices, [ 3 ] and manufacturing. [ 4 ] In these applications, tip size and shape critically affect the accuracy, resolution, and reliability of measurements and processes. [ 5 ]
Heating of an Atomic Force Microscope tip by femtosecond laser pulses
β Scribed by Alexander A. Milner; Kaiyin Zhang; Valery Garmider; Yehiam Prior
- Publisher
- Springer
- Year
- 2010
- Tongue
- English
- Weight
- 620 KB
- Volume
- 99
- Category
- Article
- ISSN
- 1432-0630
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