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Surface photovoltage and Auger electron spectromicroscopy studies of HfO2/SiO2/4H-SiC and HfO2/Al2O3/4H-SiC structures

✍ Scribed by A. Domanowska; M. Miczek; R. Ucka; M. Matys; B. Adamowicz; J. Żywicki; A. Taube; K. Korwin-Mikke; S. Gierałtowska; M. Sochacki

Book ID: 116245217
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 703 KB
Volume: 258
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2012.03.172

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