๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Surface integrity of silicon wafers in ultra precision machining

โœ Scribed by H.T. Young; H.T. Liao; H.Y. Huang


Publisher
Springer
Year
2006
Tongue
English
Weight
743 KB
Volume
29
Category
Article
ISSN
0268-3768

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Development of expert decision model to
โœ Che-Wei Chang; Chung-Chih Chen ๐Ÿ“‚ Article ๐Ÿ“… 2010 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 276 KB

In this study, we develop a two-stage decision model for managing uncertainty and imprecision of solar silicon wafer slicing evaluations during a wafer manufacturing process. Stage 1 is the evaluation process, which is performed by a procedure based on a combination of the fuzzy analytic hierarchy p