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Surface characterization of CdS0.62Se0.38by X-ray photoelectron spectroscopy

✍ Scribed by I. B. Rufus; V. Ramakrishnan; B. Viswanathan; J. C. Kuriacose

Publisher
Springer
Year
1992
Tongue
English
Weight
270 KB
Volume
11
Category
Article
ISSN
0261-8028

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Nanocrystalline Ga In Sb particles embedded in SiO matrix were grown by radio frequency RF magnetron 0.62 0.38 2 Ε½ . Ε½ . co-sputtering. X-ray diffraction XRD patterns and X-ray photoelectron spectroscopy XPS strongly support the existence of separated nanocrystalline Ga In Sb material in a SiO matri