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Measurement of the MgSe/Cd0.54Zn0.46Se valence band offset by X-ray photoelectron spectroscopy

โœ Scribed by M.W. Wang; J.F. Swenberg; R.J. Miles; M.C. Phillips; E.T. Yu; J.O. McCaldin; R.W. Grant; T.C. McGill


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
352 KB
Volume
138
Category
Article
ISSN
0022-0248

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