Surface sensitivity of X-ray photoelectron spectroscopy
โ Scribed by C.J. Powell; A. Jablonski
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 637 KB
- Volume
- 601
- Category
- Article
- ISSN
- 0168-9002
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๐ SIMILAR VOLUMES
Electrical charging of insulating samples during XPS is of direct concern for referencing the binding energy scale. Results are presented on charging of composite insulating samples that consist of an organic overlayer of polystyrene (PS) or polydimethylsiloxane (PDMS) deposited on NaCl particles. T
X-ray photoelectron spectroscopy (XPS) is a surface sensitive analytical technique that measures the binding energy of electrons in atoms and molecules on the surface of a material. XPS was used to determine the distribution of the oligosaccharide side chains in the glycoprotein, MUC1 mucin. Low-res