Surface and optical characterization of the porous silicon textured surface
β Scribed by P. N. Vinod; M. Lal
- Publisher
- Springer US
- Year
- 2005
- Tongue
- English
- Weight
- 459 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0957-4522
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π SIMILAR VOLUMES
Porous silicon (PS) films were prepared by anodization on polished and textured substrates of (1 0 0) Si at different current densities for a fixed anodization time of 30 min. Using scanning electron microscopy (SEM), high-resolution X-ray diffractometry (HRXRD) and photoluminescence (PL) decay meas
The work demonstrates that the surface atom layers of variously-prepared samples of porous silicon can, after high-temperature heat treatment in high vacuum, yield low energy electron diffraction patterns and also atomic resolution in scanning tunneling microscopy. The (100) surfaces show some patch