High Resolution Surface Structure of Porous Silicon

✍ Scribed by Li, W. ;Andrienko, I. ;Haneman, D.

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 97 KB
• Volume: 182
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/1521-396x(200011)182:1<267::aid-pssa267>3.0.co;2-g

✦ Synopsis

The work demonstrates that the surface atom layers of variously-prepared samples of porous silicon can, after high-temperature heat treatment in high vacuum, yield low energy electron diffraction patterns and also atomic resolution in scanning tunneling microscopy. The (100) surfaces show some patches of 2 Â 1 reconstruction but no clear reconstructions are visible on (111) surfaces. We also show that although evaporated metal contacts give poor reproducibility of current±voltage characteristics, the latter can be made stable and reproducible if the surfaces are first coated with a conducting polymer.