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Studies of Thermally-Carbonized Porous Silicon Surfaces

✍ Scribed by Salonen, J. ;Lehto, V.-P. ;Bj�rkqvist, M. ;Laine, E. ;Niinist�, L.

Publisher
John Wiley and Sons
Year
2000
Tongue
English
Weight
81 KB
Volume
182
Category
Article
ISSN
0031-8965

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The work demonstrates that the surface atom layers of variously-prepared samples of porous silicon can, after high-temperature heat treatment in high vacuum, yield low energy electron diffraction patterns and also atomic resolution in scanning tunneling microscopy. The (100) surfaces show some patch